Electron Microscope Facility
The core instruments of the Electron Microscope Facility are the Hitachi S-4700 Field Emission Scanning Electron Microscope (SEM) with Quorum Technologies Cryo-system, and the Philips CM30 High Resolution Transmission Electron Microscope (TEM). Both have x-ray analytical capability for elemental analysis.
The Hitachi S-4700 is a cold field emission high resolution scanning electron microscope. Capabilities include secondary electron (SE) and backscattered electron (BSE) imaging. It is equipped with an energy dispersive x-ray system which allows both qualitative and quantitative elemental analysis.
The Quorum Technologies PP2000T system allows the examination of hydrated samples. A sample can be rapidly frozen before being transferred under vacuum into the SEM for observation.
The Philips CM30 is an ultra-high resolution transmission electron microscope with a LaB6 source. It is also equipped with and energy dispersive x-ray system for elemental analysis.
Ti6Al4V alloy showing α/β
For the latest equipment and analytical costs for external clients, please refer to the Science & Engineering Services Fees Schedule.